D3186 - Rohde & Schwarz Bit Error Rate Testers

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Technical Specifications

Max. Data Rate

Max. Clock Rate

Pattern Depth

Extra Specifications
Bit Error Rate Tester

Product Description

The system covers a broad frequency range of 150 Mbps to 12.5 Gbps with 1 kHz setting resolution, providing 9 types of pseudorandom patterns, programmable word patterns and frame patterns. Complementary data outputs in binary code NRZ with a 10 mV setting resolution, minimal jitter and lowest rise and fall time waveform characteristics with phase delay settings of 1 ps step resolution are state-of-the-art features. The clock source is either internal with a 0.15 ...12.5 GHz or a 2 ... 12.5 GHz generator optionally or external, using any microwave synthesizer. R&S signal generators SMP or SMR are available, controlled from the Pattern generator front panel. The Detectors/Receiver measures the bit error rate, error count, ES and EFS as well as frequency. Special attention was taken for the eye-opening and balance, measured with a sampling oscilloscope, due to retiming circuits, essential for the system quality, the equipment tolerances and the device phase margins. Auxiliary outputs for 1/4 clock and data are available standardly. Different modes like omitt, insert, total and error addition give flexible evaluation tools. The instruments are equipped with an internal timer, GPIB, floppy disk drive and printer interface for error protocols. Features: High Input sensitivity SDH/SONET frame effective to evaluate the system synchronisation Burst-data measurement effective to examine the circulating loop test is possible Masking function for bits Error location function to specify error generation bit Error rate measurement function of area specification effective for ATM cell etc.. to measure Extra adjustment of the optimum timing and voltage at any mark ratio and even with word patterns Q factor measurement software