OBR 4400 - Luna Technologies OTDR

OBR 4400 Spec Sheet

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Technical Specifications

Wavelengths [nm]
1300, 1310, 1360, 1530, 1550, 1560, 1625

Max Pulse Width

Distance Range Max.

Extra Specifications
Optical Backscatter Reflectometer

Product Description

The OBR™ 4400 takes the industry’s first ultra-high resolution OTDR with backscatter-level sensitivity designed for component- and module-level reflectometry to the next level. With a small, easily transportable platform, the capability to “see” reflections out to 2 kilometers with no dead zone, and integrated temperature and strain sensing, the OBR 4400 gives you the ultimate in fiber diagnostics. The OBR 4400 uses swept-wavelength coherent interferometry to measure minute reflections (< 0.0003 parts per billion) in an optical system as a function of length with spatial resolution less than 50 microns. This provides the user with precision reflectometry and unprecedented optical-module inspection and diagnostic capabilities by providing the ability to locate and troubleshoot splices, connectors, fiber bends and breaks, insertion loss points, track polarization, verify PM components and more.

  • High resolution OTDR - Resolve individual features with spatial resolution down to 40 microns
  • High sensitivity - 70 dB of dynamic range and -125 dB sensitivity
  • Long range - Measure up to 500 meters in length with a single connection, single scan
  • Single Connection IL and RL - Measure insertion and return loss in a single scan
  • Locate loss events - Monitor backscatter levels to isolate losses due to bends, crimps, and bad splices
  • "Look inside” devices - Use powerful windowing feature to interrogate individual components within a subsystem
  • Polarization Tracking - Track changes in the state-of-polarization as light propagates through an optical network
  • Intuitive graphical interface - All key data and graphs in a simple, easy to use interface
  • Distributed sensing - use standard optical fiber to monitor the changes in temperature and strain