4073B Agilent Parametric Tester



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Technical Specifications

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Product Description

The 4073B Ultra Advanced Parametric Tester enables semiconductor manufacturers to dramatically reduce test time for capacitance measurements and DC measurements in high-volume semiconductor wafer manufacturing processes. It offers up to 40 percent higher throughput than the 4073A or 4072A. The 4073B is a flexible test solution. It performs precise DC measurements, capacitance measurements, flash memory cell testing, and testing of other high-frequency applications.
  • 2 microvolt and 1 femtoamp measurement resolution (HRSMU)
  • +/- 200 Volts and +/- 1 Amp output capability (HPSMU)
  • 1 kHz to 2 MHz capacitance frequency measurement range (HSCMU)
  • +/- 1.6 Amp ground unit (GNDU)
    HV-SPGU option measurement capabilities
  • +/-40 V output (80 V peak-to-peak) at high impedance
  • Pulse rise and fall times as fast as 20 ns
  • Three-level output pulse capability
  • Arbitrary Linear Waveform Generation (ALWG) function






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