4076 Agilent Parametric Tester



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Technical Specifications

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Extra Specifications
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Product Description

The 4076 meets the DC parametric, RF parametric, high frequency CV and pulsed IV measurement requirements necessitated by 65 nanometer (and below) technologies in a production test environment.

  • Covers from DC to RF
  • Supports S parameter measurement
  • Supports thin gate dielectric capacitance measurement (HFCV/RFCV)
  • Supports SOI and high-k dielectric measurement (Pulsed IV)
  • For dc measurement capabilities, see 4073A/B
  • Up to 20 GHz S parameter measurement range.
  • Up to 110 MHz HFCV and up to 8.5 GHz RFCV measurement
  • Pulsed IV as fast as 10 ns width.
    HV-SPGU Option Measurement Capabilities
  • +/-40 V output (80 V peak-to-peak) at high impedance
  • Pulse rise and fall times as fast as 20 ns
  • Three-level output pulse capability
  • Arbitrary Linear Waveform Generation (ALWG) function






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