N9020A MXA Signal Analyzer

Accelerate the Development of Wireless Devices with the Speed, Performance & Applications to Adapt to Evolving Test Requirements

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N9020A MXA Signal Analyzer

8753ES Network Analyzer

Attain Unrivaled Excellence. Find Out Why Over 70% of Engineering Teams Around the World Select Keysight Network Analyzers

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8753ES Network Analyzer

SM200B Spectrum Analyzer

The High Performance SM200B From Signal Hound: High Performance Speed, Accuracy, Security, and Agility Meet Very Low Cost

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Testimonials

  • ★★★★★

    "Fantastic deal. The oscilloscope is in very good condition. Packed for shipment to survive anything"
    Jeff
  • ★★★★★

    "Premium equipment. Excellent communication. Fast. Best value!"
    Avi
  • ★★★★★

    "Practically in new condition"
    Darcy
  • ★★★★★

    "There was a small issue; The people at BRL Test were 100% responsive and issue resolved. Thanks!"
    Mike
  • ★★★★★

    "Best packing ever! I would let you ship one of my children!"
    Todd
  • ★★★★★

    "Unit received in great shape. Passed Agilent calibration. Good job!!"
    Lee
  • ★★★★★

    "In every aspect these guys are great!"
    Sarah

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TAP2500, TAP3500 - Tektronix


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Tektronix TAP2500, TAP3500 Overview

Tektronix TAP2500, TAP3500

Active Probes

Easy-to-Use

  • Connects Directly to Oscilloscopes with the TekVPI? Probe Interface
  • Provides Automatic Units Scaling and Readout on the Oscilloscope Display
  • Easy Access to Oscilloscope Probe Menu Display for Probe Status/Diagnostic Information, and to Control Probe DC Offset

Applications

  • High-speed Digital Systems Design
  • Component Design and Characterization
  • Manufacturing Engineering and Test
  • Educational Research
  • Signals with Voltage Swings up to 8 Vp-p

TAP2500 and TAP3500 Single-ended Active FET Probes provide excellent high-speed electrical and mechanical performance required for today?s digital system designs. Specifically designed for use and direct connection to oscilloscopes with the TekVPI? probe interface, the TAP2500 and TAP3500 Active FET probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional problems:

  • Lower DUT loading effects with ≤0.8 pF input capacitance and 40 kΩ input resistance
  • Versatile DUT connectivity for attaching to small SMDs
  • Preserves instrument bandwidth at the probe tip for up to 3.5 GHz oscilloscopes
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