The Agilent 8514B test set has an architecture that develops a separate reference channel for each incident port. RF switching is done with a built-in electronic switch. For active device measurements, the test set includes the ability to apply dc bias (external) to the test port center conductors.
- 45 MHz to 20 GHz
- Separate reference channel for each incident port
- Built-in electronic switch
- 3.5 mm connectors