The 2004 Component Spectrum Analyzer™ will characterize loss, polarization dependency and return loss quickly, accurately and repeatable—all at an affordable cost.
dBm technology supports unprecedented optical repeatability, accuracy, and speed. A device can be characterized over a 100 nm span at 1 pm resolution with 1 pm and 0.015 dB accuracy in less than 1 second.
Loss measurements normally require a reference measurement—then a measurement of the loss. The 2004 eliminates the need for the reference measurement entirely by using a proprietary real-time reference. The 2004 is constantly monitoring the input power to the device and calculating the loss based on the power out of the device. In addition to speeding the measurement and eliminating the reference errors, the 2004 also eliminates the effect of variation in the source power between the reference and the loss measurement. The result: the most accurate loss measurements available anywhere.
The PDL meter function of the 2004 performs fast and accurate measurement of the polarization dependency of the device, using either all-state or matrix method. The matrix method will characterizing 100,000 points of PDL in ~1 second.
High dynamic range allows the 2004 to characterize return loss to levels approaching -70 dB. This measurement is performed simultaneously with the loss and polarization measurements, with no added time required.
The 2004 will measure both PDBW and PDCW—polarization dependency of the center wavelength and bandwidth of a filter, very quickly.