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OVA CTe - Luna Technologies Optical Spectrum Analyzers

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  • Model: OVA CTe
  • Manufactured by: Luna Technologies
  • Form Factor: Benchtop
  • High end wavelength limit: 1605 nm
  • Wavelength Resolution: 1.6pm
  • Instrument Type: fiber Bragg gratings, waveguide gratings, Mach-Zender interferometer
  • Extra Specifications: Optical Vector Analyzer

The Luna Technologies Optical Vector Analyzer (OVA) CTe is the first instrument on the market that is capable of full and complete all-parameter linear characterization of single-mode optical components. The OVA CTe provides comprehensive component characterization of fiber Bragg gratings, dispersion compensation modules, AWGs and many other optical devices. A complete vector model of the optical field, including polarization state and optical phase, is used to characterize the device under test.

  • The OVA CTe can simultaneously perform these optical component characterizations four times a second:
    • Insertion Loss (IL)
    • Return Loss (RL)
    • Polarization Dependent Loss (PDL)
    • Phase response
    • Group Delay (GD)
    • Chromatic Dispersion (CD)
    • Polarization Mode Dispersion (PMD)
    • Impulse response
    • Jones matrix elements
  • The OVA CTe offers significant advantages for optical component testing in the following categories:
    • Productivity
      The OVA CTe eliminates manufacturing bottlenecks and reduces labor cost by providing comprehensive component characterization over 40 nm in less than 2.5 seconds. Equivalent testing using currently available equipment can take 10x longer
    • Capital investment reduction
      The OVA CTe provides comprehensive analysis in a single instrument. There is no need to have multiple, expensive instruments for complete analysis
    • Ease of use
      The OVA CTe is fully automated, requiring no special skills to operate. It can be easily integrated into a manufacturing production line
    • Space savings
      The OVA CTe is a single unit that fits into one rack space, providing the same functionality as multiple-instrument configurations
  • All-parameter analysis
  • Total system integration
  • High resolution C-L band capability
  • Real-time measurements
  • Time domain viewing
  • Complete polarization response
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