BRL Test, Inc.

Electronic Test Equipment

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OVA STe - Luna Technologies Optical Spectrum Analyzers

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  • Model: OVA STe
  • Manufactured by: Luna Technologies
  • Form Factor: Benchtop
  • High end wavelength limit: 1605 nm
  • Wavelength Resolution: 1.6pm
  • Instrument Type: fiber Bragg gratings, waveguide gratings, Mach-Zender interferometer
  • Extra Specifications: Optical Vector Analyzer

The Luna Technologies Optical Vector Analyzer (OVA) STe offers the same trusted all-parameter testing capabilities as the OVA CTe, now with over 70 m of testing length. This premium long-distance feature allows the user to peer into the heart of a subsystem, system, or backplane—singling out performance of each element in the system path. As with the OVA STe, a complete vector model of the optical field, including polarization state and optical phase, is used to characterize the system under test.

  • The OVA STe can perform the following measurements:
    • Insertion Loss (IL)
    • Return Loss (RL)
    • Polarization Dependent Loss (PDL)
    • Phase response
    • Group Delay (GD)
    • Chromatic Dispersion (CD)
    • Polarization Mode Dispersion (PMD)
    • Impulse response
    • Jones matrix elements
  • The OVA STe offers significant advantages for optical component testing in the following categories:
    • Productivity
      The OVA STe eliminates manufacturing bottlenecks and reduces labor cost by providing comprehensive component characterization over 40 nm in less than 2.5 seconds. Equivalent testing using currently available equipment can take 10x longer
    • Capital investment reduction
      The OVA STe provides comprehensive analysis in a single instrument. There is no need to have multiple, expensive instruments for complete analysis
    • Ease of use
      The OVA STe is fully automated, requiring no special skills to operate. It can be easily integrated into a manufacturing production line
    • Space savings
      The OVA STe is a single unit that fits into one rack space, providing the same functionality as multiple-instrument configurations
  • All-parameter analysis
  • Total system integration
  • High resolution C-L band capability
  • Real-time measurements
  • Time domain viewing
  • Complete polarization response
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