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4073B - Keysight / Agilent Parametric Testers


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  • Model: 4073B
  • Manufactured by: Keysight / Agilent
  • Extra Specifications: Expert onsite installation, up and running fast, no worries.
The 4073B Ultra Advanced Parametric Tester enables semiconductor manufacturers to dramatically reduce test time for capacitance measurements and DC measurements in high-volume semiconductor wafer manufacturing processes. It offers up to 40 percent higher throughput than the 4073A or 4072A. The 4073B is a flexible test solution. It performs precise DC measurements, capacitance measurements, flash memory cell testing, and testing of other high-frequency applications.
  • 2 microvolt and 1 femtoamp measurement resolution (HRSMU)
  • +/- 200 Volts and +/- 1 Amp output capability (HPSMU)
  • 1 kHz to 2 MHz capacitance frequency measurement range (HSCMU)
  • +/- 1.6 Amp ground unit (GNDU)
    HV-SPGU option measurement capabilities
  • +/-40 V output (80 V peak-to-peak) at high impedance
  • Pulse rise and fall times as fast as 20 ns
  • Three-level output pulse capability
  • Arbitrary Linear Waveform Generation (ALWG) function

  • Your IP Address is: 54.198.195.11