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4076 - Keysight / Agilent Parametric Testers


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  • Model: 4076
  • Manufactured by: Keysight / Agilent
  • Extra Specifications: Expert onsite installation, up and running fast, no worries.
The 4076 meets the DC parametric, RF parametric, high frequency CV and pulsed IV measurement requirements necessitated by 65 nanometer (and below) technologies in a production test environment.

  • Covers from DC to RF
  • Supports S parameter measurement
  • Supports thin gate dielectric capacitance measurement (HFCV/RFCV)
  • Supports SOI and high-k dielectric measurement (Pulsed IV)
  • For dc measurement capabilities, see 4073A/B
  • Up to 20 GHz S parameter measurement range.
  • Up to 110 MHz HFCV and up to 8.5 GHz RFCV measurement
  • Pulsed IV as fast as 10 ns width.
    HV-SPGU Option Measurement Capabilities
  • +/-40 V output (80 V peak-to-peak) at high impedance
  • Pulse rise and fall times as fast as 20 ns
  • Three-level output pulse capability
  • Arbitrary Linear Waveform Generation (ALWG) function

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