NFPH20A - YIC NFP Probe Kit

YIC NFPH20A Overview

Live Tracking: A Rapid Handheld Probe Scanning Solution

Live tracking provides a faster, easier, and more reliable method to get these results. Using an overhead webcam and probe markers, EMViewer will detect the type of probe and point of measurement automatically, allowing design engineers to see results quickly with minimal setup time.

The Near Field Probe (NFP) Kit helps enhance product testing with reliable and accurate live scanning for highlighting EMC & EMI issues.

The probes are used to locate, identify, measure, and characterise potential sources of electromagnetic radiation.

Designed by Y.I.C. Technologies, the NFP Kit is designed for measuring near-field emissions for EMC/EMI troubleshooting and pre-compliance testing. Interference radiated from traces or components of electronic PCBs, assemblies, cables, enclosures, or products can also be located. The probe output is proportional to the magnetic field (H) strength present at the probe location.

Ideal PCB projects for EMScanner are boards designed for high speed, high power, and/or high density/complexity. Any PCB that places a premium onboard real estate also qualifies as an excellent candidate. The compact, flat scanner provides PCB design teams with an easy-to-use, cost-effective, and proven tabletop solution. Emission, immunity, filtering, EMI shielding, broadband noise, and Common Mode testing are some of the applications that the EMScanner system addresses in mere seconds.

YIC Technologies Near-Field Probe Kit Contents

Handheld Probe Set:

• Handheld Probes Handle
• NFPE10A Full Range E Field Probe
• NFPH10A 10MHz-350MHz H Field Probe
• NFPH20A 300MHz-3.5GHz H Field Probe
• NFPH30A 3GHz-18GHz H Field Probe

Camera:

• Camera USB Mini Camera
• 5 Mega Pixels
• 5-50mm Varifocal Lens
• 10X Optical Zoom

Support Arm:

• 11 Inch Support Arm
• Clamp
• Adjustable Support Arm

Y.I.C. Technologies set of EM probes kit designed for measuring near field radiated emissions for EMC/EMI pre-compliance testing.

The probes can be used to locate, identify, measure and characterize potential sources of electromagnetic radiation and interference radiated from traces or components of electronic PCBs, assemblies or products. The probe output is proportional to the magnetic field (H) strength present at the probe location.

A compatible Spectrum Analyzer with 50Ω input is required and the probes can be used as handheld standalone probes or mounted on Y.I.C. Technologies EMProbe robotic arm for high resolution scans.