YIC NFPH30A Overview
Powerful near-field H probes for EMC/EMI troubleshooting
Live Tracking: A Rapid Handheld Probe Scanning Solution
Live tracking provides a faster, easier, and more reliable method to get these results. Using an overhead webcam and probe markers, EMViewer will detect the type of probe and point of measurement automatically, allowing design engineers to see results quickly with minimal setup time.
The Near Field Probe (NFP) Kit helps enhance product testing with reliable and accurate live scanning for highlighting EMC & EMI issues.
The probes are used to locate, identify, measure, and characterise potential sources of electromagnetic radiation.
Designed by Y.I.C. Technologies, the NFP Kit is designed for measuring near-field emissions for EMC/EMI troubleshooting and pre-compliance testing. Interference radiated from traces or components of electronic PCBs, assemblies, cables, enclosures, or products can also be located. The probe output is proportional to the magnetic field (H) strength present at the probe location.
Ideal PCB projects for EMScanner are boards designed for high speed, high power, and/or high density/complexity. Any PCB that places a premium onboard real estate also qualifies as an excellent candidate. The compact, flat scanner provides PCB design teams with an easy-to-use, cost-effective, and proven tabletop solution. Emission, immunity, filtering, EMI shielding, broadband noise, and Common Mode testing are some of the applications that the EMScanner system addresses in mere seconds.
- Fully integrated with EMViewer software and EMProbe
- Live real-time probe position tracking
- Normalization and correction when using the EMViewer software
- Flat response within the range of operation
- Slim Design and Protective Coating
- 18GHz Measured Cable included
- EMC/EMI Pre-Compliance Magnetic Near-Field Measurements:
- Magnetic Near Field Mapping
- Magnetic Immunity Testing
YIC Technologies Near-Field Probe Kit Contents
Handheld Probe Set:
- Handheld Probes Handle
- NFPE10A Full Range E Field Probe
- NFPH10A 10MHz-350MHz H Field Probe
- NFPH20A 300MHz-3.5GHz H Field Probe
- NFPH30A 3GHz-18GHz H Field Probe
- Camera USB Mini Camera
- 5 Mega Pixels
- 5-50mm Varifocal Lens
- 10X Optical Zoom
- 11 Inch Support Arm
- Adjustable Support Arm
Y.I.C. Technologies set of EM probes kit designed for measuring near field radiated emissions for EMC/EMI pre-compliance testing.
The probes can be used to locate, identify, measure and characterize potential sources of electromagnetic radiation and interference radiated from traces or components of electronic PCBs, assemblies or products. The probe output is proportional to the magnetic field (H) strength present at the probe location.
A compatible Spectrum Analyzer with 50Ω input is required and the probes can be used as handheld standalone probes or mounted on Y.I.C. Technologies EMProbe robotic arm for high resolution scans.
YIC Technologies’ Near-Field Probe Kits Videos